Invention Grant
- Patent Title: Abnormality detection method, device and program
- Patent Title (中): 异常检测方法,设备和程序
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Application No.: US12709832Application Date: 2010-02-22
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Publication No.: US08352790B2Publication Date: 2013-01-08
- Inventor: Hiromitsu Nakagawa , Yasuhide Mori , Tomohiro Nakamura , Katsuro Kikuchi
- Applicant: Hiromitsu Nakagawa , Yasuhide Mori , Tomohiro Nakamura , Katsuro Kikuchi
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2009-177978 20090730
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
Model data is generated from performance information sorted by day of the week, time period, and process status by a performance information analysis section and a process status analysis section. An abnormality determination section detects abnormality using appropriate model data. What the graph of an expected status is like, how much the graph of the current status that has been determined abnormal differs from the graph of the expected status, and how much the current status is like the expected status are displayed allowing a system manager to observe detailed information about abnormality determination.
Public/Granted literature
- US20110029817A1 ABNORMALITY DETECTION METHOD, DEVICE AND PROGRAM Public/Granted day:2011-02-03
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