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US08352891B2 Layout decomposition based on partial intensity distribution 有权
基于部分强度分布的布局分解

Layout decomposition based on partial intensity distribution
Abstract:
Layout design data are decomposed for double dipole lithography based on partial intensity distribution information. The partial intensity distribution information is generated by performing optical simulations on the layout design data. The layout decomposition may further be adjusted during an optical proximity correction process. The adjustment may utilize the partial intensity distribution information.
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