Systems and methods for distribution analysis of a stacked-die integrated circuit (IC) are described. The stacked-die integrated circuit includes a primary die, and clock load information for the primary die of the IC is determined. Additionally, a clock load model may be created using the clock load information for the primary die. Clock load information for a second die that is coupled to the primary die may also be determined. The clock load information for the second die may be incorporated into the clock load model to create an enhanced clock load model of the stacked-die IC, which may then be analyzed as if a single-die IC.