Invention Grant
US08352897B2 Calculating waveform deterioration amount for determining pin placement 有权
计算用于确定针位置的波形恶化量

  • Patent Title: Calculating waveform deterioration amount for determining pin placement
  • Patent Title (中): 计算用于确定针位置的波形恶化量
  • Application No.: US13071654
    Application Date: 2011-03-25
  • Publication No.: US08352897B2
    Publication Date: 2013-01-08
  • Inventor: Daita Tsubamoto
  • Applicant: Daita Tsubamoto
  • Applicant Address: JP Kawasaki
  • Assignee: Fujitsu Limited
  • Current Assignee: Fujitsu Limited
  • Current Assignee Address: JP Kawasaki
  • Agency: Squire Sanders (US) LLP
  • Priority: JP2010-79628 20100330
  • Main IPC: G06F17/50
  • IPC: G06F17/50
Calculating waveform deterioration amount for determining pin placement
Abstract:
A pin placement determining method includes calculating a waveform deterioration amount of wires from a noise amount of the wires and wiring loss of the wires, the wires being coupled to a connector on a printed board, comparing the calculated waveform deterioration amount of the wires to an evaluation criteria, evaluating the wires in which the waveform deterioration amount exceeds the evaluation criteria, and replacing corresponding pins of the connectors to which the wires that have been evaluated as exceeding the evaluation criteria are coupled with replacement pins of connectors that have a low noise amount.
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