发明授权
- 专利标题： Inspection chip equipped with a light amplifier element
- 专利标题（中）： 检测芯片配有光放大器元件
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申请号： US11628306申请日： 2005-05-23
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公开(公告)号： US08354073B2公开(公告)日： 2013-01-15
- 发明人: Yuji Oki , Satoru Kuhara
- 申请人： Yuji Oki , Satoru Kuhara
- 申请人地址： JP Fukuoka
- 专利权人： Kyushu University, National University Corporation
- 当前专利权人： Kyushu University, National University Corporation
- 当前专利权人地址： JP Fukuoka
- 代理机构： Birch, Stewart, Kolasch & Birch, LLP
- 优先权： JP2004-167297 20040604
- 国际申请： PCT/JP2005/009364 WO 20050523
- 国际公布： WO2005/119210 WO 20051215
- 主分类号： G01N15/06
- IPC分类号： G01N15/06 ; G01N33/00 ; G01N33/48
摘要：
The present invention provides an inspection chip using light, which is able to provide an irradiation of light at a high precision. The present invention further provides an inspection chip capable of carrying out the inspection of a sample in a simple manner by using a plurality of lights.The inspection chip of the present invention comprises a light amplifier element and a sample holding section for holding a sample, in which the light amplifier element is oriented so as to face to the sample holding section, so that the light emitted from the light amplifier element can irradiate the sample held in the sample holding section.
公开/授权文献
- US20070253460A1 Inspection Chip Equipped with a Light Amplifier Element 公开/授权日：2007-11-01
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