Invention Grant
- Patent Title: Spherical-form measuring apparatus
- Patent Title (中): 球形测量装置
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Application No.: US13009227Application Date: 2011-01-19
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Publication No.: US08356417B2Publication Date: 2013-01-22
- Inventor: Takeshi Hagino , Yuichiro Yokoyama
- Applicant: Takeshi Hagino , Yuichiro Yokoyama
- Applicant Address: JP Kawasaki-shi
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kawasaki-shi
- Agency: Rankin, Hill & Clark LLP
- Priority: JP2010-009805 20100120; JP2010-182096 20100817
- Main IPC: G01B7/28
- IPC: G01B7/28 ; G01B5/20

Abstract:
A spherical-form measuring apparatus which efficiently measures the sphericity and the form of a sphere to be measured with use of the mechanism of a roundness measuring machine, including a turntable, a probe for measuring a contour of a sphere to be measured on an equatorial plane parallel to a surface of the turntable, associated with rotation of the turntable, and a holding unit mounted on the turntable, for holding the sphere to be measured, wherein the holding unit positions the center of the sphere to be measured on a rotational axis of the turntable, and holds the sphere to be measured so that the sphere is rotatable about an inclined axis which passes the center of the sphere and is inclined at the angle in the range of −5 degrees-+5 degrees centered on the angle where the sine is 1√3 (1 divided by the square root of 3) against the surface of the turntable.
Public/Granted literature
- US20110173830A1 SPHERICAL-FORM MEASURING APPARATUS Public/Granted day:2011-07-21
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