发明授权
- 专利标题: Particle beam irradiation system and particle beam therapy system
- 专利标题(中): 粒子束照射系统和粒子束治疗系统
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申请号: US12866169申请日: 2009-08-27
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公开(公告)号: US08357911B2公开(公告)日: 2013-01-22
- 发明人: Takaaki Iwata
- 申请人: Takaaki Iwata
- 申请人地址: JP Chiyoda-Ku, Tokyo
- 专利权人: Mitsubishi Electric Corporation
- 当前专利权人: Mitsubishi Electric Corporation
- 当前专利权人地址: JP Chiyoda-Ku, Tokyo
- 代理机构: Buchanan Ingersoll & Rooney PC
- 国际申请: PCT/JP2009/064969 WO 20090827
- 国际公布: WO2011/024278 WO 20110303
- 主分类号: H01J1/50
- IPC分类号: H01J1/50
摘要:
The objective is to eliminate the effect of the hysteresis of a scanning electromagnet so that there is obtained a particle beam irradiation system that realizes high-accuracy beam irradiation. There are provided a magnetic-field sensor that measures the magnetic field of a scanning electromagnet and an irradiation control apparatus that controls the scanning electromagnet based on a measurement magnetic field measured by the magnetic-field sensor and target irradiation position coordinates of a charged particle beam. The irradiation control apparatus is provided with an inverse map means that calculates a target magnetic field, based on the target irradiation position coordinates of the charged particle beam; and a compensator that outputs a control input, to the scanning electromagnet, for controlling the magnetic-field error between the target magnetic field and the measurement magnetic field to be the same as or smaller than a predetermined threshold value.
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