发明授权
US08358339B2 Testing method, testing and processing system, processing device, testing device, manufacturing/testing device, and manufacturing/testing method
失效
测试方法，测试和处理系统，处理设备，测试设备，制造/测试设备，以及制造/测试方法
- 专利标题： Testing method, testing and processing system, processing device, testing device, manufacturing/testing device, and manufacturing/testing method
- 专利标题（中）： 测试方法，测试和处理系统，处理设备，测试设备，制造/测试设备，以及制造/测试方法
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申请号： US12373350申请日： 2007-07-25
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公开(公告)号： US08358339B2公开(公告)日： 2013-01-22
- 发明人: Kenta Hayashi
- 申请人： Kenta Hayashi
- 申请人地址： JP Tokyo
- 专利权人： Dai Nippon Printing Co., Ltd
- 当前专利权人： Dai Nippon Printing Co., Ltd
- 当前专利权人地址： JP Tokyo
- 代理机构： Young & Thompson
- 优先权： JP2006-205080 20060727; JP2006-206968 20060728; JP2006-208778 20060731
- 国际申请： PCT/JP2007/064549 WO 20070725
- 国际公布： WO2008/013188 WO 20080131
- 主分类号： H04N7/18
- IPC分类号： H04N7/18 ; H04N9/47
摘要：
An inspecting method for grasping the inspection result on an intermediate (or an n-th) treatment without long extension of time, in case predetermined treatments of a predetermined number (N times) are exerted on a plurality of sheets running on a conveyor line, before all the treatments of N-times are ended. The inspecting method for inspecting an object subjected to the predetermined treatment includes performing the predetermined treatment repeatedly by the N-times (N: a natural number of 2 or more) sequentially on the individual objects being conveyed on the conveyor line, and an inspecting step of testing such a leading one of the objects as has been subjected to the n-th (n: a natural number of 1 or more but N or less) treatment, and returning the tested object to after such one of the targets as was subjected to the n-th treatment.
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