Invention Grant
- Patent Title: Surface texture measuring device
- Patent Title (中): 表面纹理测量装置
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Application No.: US12966460Application Date: 2010-12-13
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Publication No.: US08359908B2Publication Date: 2013-01-29
- Inventor: Keiji Yamada , Norimichi Ota , Hideki Shindo
- Applicant: Keiji Yamada , Norimichi Ota , Hideki Shindo
- Applicant Address: JP Kanagawa
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2009-285035 20091216
- Main IPC: G01B5/28
- IPC: G01B5/28

Abstract:
A surface texture measuring device includes a rotation driving device configured to rotate a measured substance, a roughness detector including a stylus provided displaceably at a tip of a detector main body and at least one skid provided at the tip of the detector main body and in the proximity of the stylus and outputting displacement of the stylus based on the skid as an electric signal, and a detector driving device configured to drive a detector holder. The detector holder includes a guide member driven by the detector driving device, a slide member configured to hold the roughness detector and provided slidably in a displacement direction of the stylus to the guide member, and an urging member configured to urge the slide member so that the skid always comes in contact with the measurement face of the measured substance.
Public/Granted literature
- US20110138895A1 SURFACE TEXTURE MEASURING DEVICE Public/Granted day:2011-06-16
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