Invention Grant
US08361838B2 Semiconductor package and method for manufacturing the same via holes in semiconductor chip for plurality stack chips
有权
用于制造用于多个堆叠芯片的半导体芯片中的相同通孔的半导体封装和方法
- Patent Title: Semiconductor package and method for manufacturing the same via holes in semiconductor chip for plurality stack chips
- Patent Title (中): 用于制造用于多个堆叠芯片的半导体芯片中的相同通孔的半导体封装和方法
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Application No.: US13241812Application Date: 2011-09-23
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Publication No.: US08361838B2Publication Date: 2013-01-29
- Inventor: Seung Taek Yang , Min Suk Suh , Seung Hyun Lee , Jong Hoon Kim
- Applicant: Seung Taek Yang , Min Suk Suh , Seung Hyun Lee , Jong Hoon Kim
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Ladas & Parry LLP
- Priority: KR10-2008-0023041 20080312
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L23/48

Abstract:
A stacked semiconductor package and a method for manufacturing the same are presented which exhibit a reduced electrical resistance and an increased junction force. The semiconductor package includes at least two semiconductor chips stacked upon each other. Each semiconductor chip has a plurality of bonding pads formed on upper surfaces and has via-holes. First wiring lines are located on the upper surfaces of the semiconductor chips, on the surfaces of the via-holes, and respectively connected onto their respective bonding pads. Second wiring lines are located on lower surfaces of the semiconductor chips and on the surfaces of the respective via-holes which connect to their respective first wiring lines. The semiconductor chips are stacked so that the first wiring lines on an upper surface of an upwardly positioned semiconductor chip are respectively joined with corresponding second wiring lines formed on a lower surface of a downwardly positioned semiconductor chip.
Public/Granted literature
- US20120009736A1 SEMICONDUCTOR PACKAGE AND METHOD FOR MANUFACTURING THE SAME Public/Granted day:2012-01-12
Information query
IPC分类: