发明授权
- 专利标题: Shape measurement apparatus and calibration method
- 专利标题(中): 形状测量装置和校准方法
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申请号: US13088704申请日: 2011-04-18
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公开(公告)号: US08363929B2公开(公告)日: 2013-01-29
- 发明人: Takeshi Kojima , Daisuke Mitsumoto , Yasuhiro Ohnishi , Tuo Zhuang , Yasumoto Mori
- 申请人: Takeshi Kojima , Daisuke Mitsumoto , Yasuhiro Ohnishi , Tuo Zhuang , Yasumoto Mori
- 申请人地址: JP Kyoto
- 专利权人: OMRON Corporation
- 当前专利权人: OMRON Corporation
- 当前专利权人地址: JP Kyoto
- 代理机构: Greenblum & Bernstein P.L.C.
- 优先权: JP2010-100994 20100426
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; G06K9/46
摘要:
The shape measurement apparatus calculates a characteristic amount for a plurality of points of interest on a surface of a measurement target object, based on an image obtained by image capturing with a camera, calculates an orientation of a normal line based on a value of the characteristic amount by referencing data stored in advance in a storage device, and restores the three-dimensional shape of the surface of the measurement target object based on a result of the calculation. The storage device stores a plurality of data sets generated respectively for a plurality of reference positions arranged in a field of view of the camera, and the data set to be referenced is switched depending on a position of a point of interest.
公开/授权文献
- US20110262007A1 SHAPE MEASUREMENT APPARATUS AND CALIBRATION METHOD 公开/授权日:2011-10-27
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