发明授权
- 专利标题: Particle-optical system
- 专利标题(中): 粒子光学系统
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申请号: US11990067申请日: 2006-08-08
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公开(公告)号: US08368015B2公开(公告)日: 2013-02-05
- 发明人: Elmar Platzgummer , Gerhard Stengl , Helmut Falkner
- 申请人: Elmar Platzgummer , Gerhard Stengl , Helmut Falkner
- 申请人地址: DE Jena
- 专利权人: Carl Zeiss SMS GmbH
- 当前专利权人: Carl Zeiss SMS GmbH
- 当前专利权人地址: DE Jena
- 代理商 Bruce D Riter
- 优先权: EP05017318 20050809
- 国际申请: PCT/EP2006/007849 WO 20060808
- 国际公布: WO2007/017255 WO 20070215
- 主分类号: G01N23/00
- IPC分类号: G01N23/00 ; G21K7/00
摘要:
The present invention relates to a multi-beamlet multi-column particle-optical system comprising a plurality of columns which are disposed in an array for simultaneously exposing a substrate, each column having an optical axis and comprising: a beamlet generating arrangement comprising at least one multi-aperture plate for generating a pattern of multiple beamlets of charged particles, and an electrostatic lens arrangement comprising at least one electrode element; the at least one electrode element having an aperture defined by an inner peripheral edge facing the optical axis, the aperture having a center and a predetermined shape in a plane orthogonal to the optical axis; wherein in at least one of the plurality of columns, the predetermined shape of the aperture is a non-circular shape with at least one of a protrusion and an indentation from an ideal circle about the center of the aperture.
公开/授权文献
- US20100270474A1 Particle-Optical System 公开/授权日:2010-10-28
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