Invention Grant
- Patent Title: Measuring a time period
- Patent Title (中): 测量一段时间
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Application No.: US13079214Application Date: 2011-04-04
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Publication No.: US08368408B2Publication Date: 2013-02-05
- Inventor: James E. Bartling
- Applicant: James E. Bartling
- Applicant Address: US AZ Chandler
- Assignee: Microchip Technology Incorporated
- Current Assignee: Microchip Technology Incorporated
- Current Assignee Address: US AZ Chandler
- Agency: King & Spalding L.L.P.
- Main IPC: G01R27/26
- IPC: G01R27/26

Abstract:
A time period of an event is determined by charging a known value capacitor from a constant current source during the event. The resultant voltage on the capacitor is proportional to the event time period and may be calculated from the resultant voltage and known capacitance value. Capacitance is measured by charging a capacitor from a constant current source during a known time period. The resultant voltage on the capacitor is proportional to the capacitance thereof and may be calculated from the resultant voltage and known time period. A long time period event may be measured by charging a first capacitor at the start of the event and a second capacitor at the end of the event, while counting clock times therebetween. Delay of an event is done by charging voltages on first and second capacitors at beginning and end of event, while comparing voltages thereon with a reference voltage.
Public/Granted literature
- US20110178767A1 MEASURING A TIME PERIOD Public/Granted day:2011-07-21
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