Invention Grant
US08368774B2 Imaging geometries for scanning optical detectors with overlapping fields of regard and methods for providing and utilizing same
有权
用于扫描具有重叠领域的光学检测器的成像几何和用于提供和利用相同的方法
- Patent Title: Imaging geometries for scanning optical detectors with overlapping fields of regard and methods for providing and utilizing same
- Patent Title (中): 用于扫描具有重叠领域的光学检测器的成像几何和用于提供和利用相同的方法
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Application No.: US12952079Application Date: 2010-11-22
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Publication No.: US08368774B2Publication Date: 2013-02-05
- Inventor: Thomas J Grycewicz
- Applicant: Thomas J Grycewicz
- Applicant Address: US CA El Segundo
- Assignee: The Aerospace Corporation
- Current Assignee: The Aerospace Corporation
- Current Assignee Address: US CA El Segundo
- Agency: Henricks, Slavin & Holme LLP
- Main IPC: H04N5/228
- IPC: H04N5/228 ; H04N3/14 ; G06K9/00 ; G06K9/32 ; G06K9/40

Abstract:
Imaging devices and techniques that utilize multiple optical detectors are described and, in particular, imaging geometries for imaging devices that include three or more optical detectors with overlapping fields of regard. The imaging geometries are determined and provided in consideration of one or more performance criteria evaluated over multiple different operating conditions for a process of generating a reconstructed image from the captured images. Imaging systems and methods utilizing the imaging geometries are also described.
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