Invention Grant
- Patent Title: 3D inter-stratum connectivity robustness
- Patent Title (中): 3D层间连通性鲁棒性
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Application No.: US13217381Application Date: 2011-08-25
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Publication No.: US08381156B1Publication Date: 2013-02-19
- Inventor: Michael P. Beakes , Shih-Hsien Lo , Michael R. Scheuermann , Matthew R. Wordeman
- Applicant: Michael P. Beakes , Shih-Hsien Lo , Michael R. Scheuermann , Matthew R. Wordeman
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Tutunjian & Bitetto, P.C.
- Agent Louis J. Percello
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
There is provided a method for verifying inter-stratum connectivity for two or more strata to be combined into a 3D chip stack. Each of the two or more strata has 3D elements including active 3D elements, mechanical 3D elements, and dummy 3D elements. The method includes performing a respective 2D layout versus schematic verification on each of the two or more strata with respect to at least the 3D elements to pre-ensure an absence of shorts between the 3D elements when the two or more strata are subsequently stacked into the 3D chip stack. The method further includes checking inter-stratum interconnectivity between each adjacent pair of strata in the 3D chip stack.
Public/Granted literature
- US20130055183A1 3D INTER-STRATUM CONNECTIVITY ROBUSTNESS Public/Granted day:2013-02-28
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