发明授权
- 专利标题: Method of crystallizing amorphous semiconductor film, thin-film transistor, semiconductor device, display device, and method of manufacturing the same
- 专利标题(中): 结晶非晶半导体膜,薄膜晶体管,半导体器件,显示器件及其制造方法的方法
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申请号: US12888779申请日: 2010-09-23
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公开(公告)号: US08384086B2公开(公告)日: 2013-02-26
- 发明人: Kazushi Yamayoshi , Toru Takeguchi , Kazutoshi Aoki
- 申请人: Kazushi Yamayoshi , Toru Takeguchi , Kazutoshi Aoki
- 申请人地址: JP Tokyo
- 专利权人: Mitsubishi Electric Corporation
- 当前专利权人: Mitsubishi Electric Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2009-229635 20091001
- 主分类号: H01L27/108
- IPC分类号: H01L27/108
摘要:
A method of crystallizing an amorphous semiconductor film, the method comprising the steps of: forming a gate electrode on a transparent insulating substrate; forming a gate insulating film on the transparent insulating substrate and on an upper part of the gate electrode; forming an amorphous semiconductor film on the gate insulating film; forming a light-transmissive insulating film on the amorphous semiconductor film; forming a metal film having an opening on the light-transmissive insulating film; irradiating laser light onto both a region of the light-transmissive insulating film exposed by the opening and the metal film, which is used as a mask for shielding the laser light; and performing laser annealing to make the laser light to be absorbed through the light-transmissive insulating film into a region of the amorphous semiconductor film exposed by the opening, so that the amorphous semiconductor film is heated and converted to a crystalline semiconductor film.
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