Invention Grant
- Patent Title: Terminal resistance device, semiconductor device, and control method for terminal resistance
- Patent Title (中): 端子电阻器件，半导体器件和端子电阻的控制方法
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Application No.: US12626793Application Date: 2009-11-27
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Publication No.: US08384422B2Publication Date: 2013-02-26
- Inventor: Yuuji Matsui , Noriaki Suyama
- Applicant: Yuuji Matsui , Noriaki Suyama
- Applicant Address: JP Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Young & Thompson
- Priority: JP2008-304756 20081128
- Main IPC: H03K17/16
- IPC: H03K17/16 ; H03K19/003
Abstract:
One aspect of the invention is a terminal resistance device including a variable terminal resistance unit including a plurality of first terminal resistance elements connectable to a transmission path and a terminal resistance control unit that transmits a first control signal of a thermometer code to the variable terminal resistance unit. The first terminal resistance elements have the same resistance value and the first control signal is a signal for selecting the first terminal resistance elements to be connected to the transmission path.
Public/Granted literature
- US20100134214A1 TERMINAL RESISTANCE DEVICE, SEMICONDUCTOR DEVICE, AND CONTROL METHOD FOR TERMINAL RESISTANCE Public/Granted day:2010-06-03
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