- 专利标题： Authentication of integrated circuits
-
申请号： US13039391申请日： 2011-03-03
-
公开(公告)号： US08386801B2公开(公告)日： 2013-02-26
- 发明人: Srinivas Devadas , Blaise Gassend
- 申请人： Srinivas Devadas , Blaise Gassend
- 申请人地址： US MA Cambridge
- 专利权人： Massachusetts Institute of Technology
- 当前专利权人： Massachusetts Institute of Technology
- 当前专利权人地址： US MA Cambridge
- 代理机构： Occhiuti Rohlicek & Tsao LLP
- 主分类号： G06F21/00
- IPC分类号： G06F21/00
摘要：
A group of devices are fabricated based on a common design, each device having a corresponding plurality of measurable characteristics that is unique in the group to that device, each device having a measurement module for measuring the measurable characteristics. Authentication of one of the group of devices is enabled by selective measurement of one or more of the plurality of measurable characteristics of the device.
公开/授权文献
- US20120033810A1 AUTHENTICATION OF INTEGRATED CIRCUITS 公开/授权日：2012-02-09
信息查询
