发明授权
- 专利标题: Semiconductor circuit design support technique
- 专利标题(中): 半导体电路设计支持技术
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申请号: US12358888申请日: 2009-01-23
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公开(公告)号: US08386989B2公开(公告)日: 2013-02-26
- 发明人: Takahide Yoshikawa
- 申请人: Takahide Yoshikawa
- 申请人地址: JP Kawasaki
- 专利权人: Fujitsu Limited
- 当前专利权人: Fujitsu Limited
- 当前专利权人地址: JP Kawasaki
- 代理机构: Greer, Burns & Crain, Ltd.
- 优先权: JP2008-135003 20080523
- 主分类号: G06F11/22
- IPC分类号: G06F11/22 ; G06F17/50
摘要:
Designation of observation points in an observation target circuit for which operations are observed in simulation is accepted, and circuit data of an observation circuit is attached to circuit data of the observation target circuit so that the observation circuit is connected to the observation target circuit according to designation data of the observation points. At this time, a double-buffer configuration is adopted for the observation circuit, and the number of occurrence times of a specific state at a specific observation point during a first period and the number of occurrence times of the specific state at the specific observation point during a second period are alternately outputted and stored into RAM.
公开/授权文献
- US20090293025A1 SEMICONDUCTOR CIRCUIT DESIGN SUPPORT TECHNIQUE 公开/授权日:2009-11-26
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