Invention Grant
US08390486B2 Automatic offset adjustment for digital calibration of column parallel single-slope ADCs for image sensors 有权
用于图像传感器的列并行单斜率ADC的数字校准的自动偏移调整

Automatic offset adjustment for digital calibration of column parallel single-slope ADCs for image sensors
Abstract:
Various embodiments of the present invention include enabling, during a calibration phase, a counter to count one less than a number of clock periods associated with a determined offset. The counted number of the clock periods is stored in calibration memory. In a conversion phase, inverted outputs are loaded from the calibration memory to the counter, where the counter is enabled to count the clock periods to determine a digital equivalent value of an analog signal amplitude.
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