Invention Grant
US08390486B2 Automatic offset adjustment for digital calibration of column parallel single-slope ADCs for image sensors
有权
用于图像传感器的列并行单斜率ADC的数字校准的自动偏移调整
- Patent Title: Automatic offset adjustment for digital calibration of column parallel single-slope ADCs for image sensors
- Patent Title (中): 用于图像传感器的列并行单斜率ADC的数字校准的自动偏移调整
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Application No.: US13118991Application Date: 2011-05-31
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Publication No.: US08390486B2Publication Date: 2013-03-05
- Inventor: Yibing Michelle Wang , Jeff Rysinski , Hongyu Wang , Sang-Soo Lee
- Applicant: Yibing Michelle Wang , Jeff Rysinski , Hongyu Wang , Sang-Soo Lee
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Main IPC: H03M1/06
- IPC: H03M1/06

Abstract:
Various embodiments of the present invention include enabling, during a calibration phase, a counter to count one less than a number of clock periods associated with a determined offset. The counted number of the clock periods is stored in calibration memory. In a conversion phase, inverted outputs are loaded from the calibration memory to the counter, where the counter is enabled to count the clock periods to determine a digital equivalent value of an analog signal amplitude.
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