Invention Grant
- Patent Title: Calibration device and optical characteristic measuring system using the same
- Patent Title (中): 校准装置和使用其的光学特性测量系统
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Application No.: US12953056Application Date: 2010-11-23
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Publication No.: US08390803B2Publication Date: 2013-03-05
- Inventor: Shinichi Iida , Wataru Yamaguchi
- Applicant: Shinichi Iida , Wataru Yamaguchi
- Applicant Address: JP Osaka
- Assignee: Konica Minolta Sensing, Inc.
- Current Assignee: Konica Minolta Sensing, Inc.
- Current Assignee Address: JP Osaka
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2009-270407 20091127; JP2010-216819 20100928
- Main IPC: G01J1/10
- IPC: G01J1/10 ; G01J3/42
Abstract:
A calibration device 21 according to the present invention is a member used for white calibration of an optical characteristic measuring apparatus 1 for measuring an optical characteristic of a specimen arranged to close a measuring opening and is used together with a spacer 24. Accordingly, such a calibration device 21 can perform more accurate white calibration by preventing formation of an interference pattern by the spacer 24.
Public/Granted literature
- US20110128540A1 CALIBRATION DEVICE AND OPTICAL CHARACTERISTIC MEASURING SYSTEM USING THE SAME Public/Granted day:2011-06-02
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