发明授权
- 专利标题: Antenna testing device and antenna testing method using the same
- 专利标题(中): 天线测试装置和使用天线的天线测试方法
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申请号: US12713267申请日: 2010-02-26
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公开(公告)号: US08392134B2公开(公告)日: 2013-03-05
- 发明人: Zhan Li , Ye Xiong , Ge Zhang
- 申请人: Zhan Li , Ye Xiong , Ge Zhang
- 申请人地址: CN Shenzhen HK Kowloon
- 专利权人: Shenzhen Futaihong Precision Industry Co., Ltd.,FIH (Hong Kong) Limited
- 当前专利权人: Shenzhen Futaihong Precision Industry Co., Ltd.,FIH (Hong Kong) Limited
- 当前专利权人地址: CN Shenzhen HK Kowloon
- 代理机构: Altis Law Group, Inc.
- 优先权: CN200910305458 20090810
- 主分类号: G01R23/16
- IPC分类号: G01R23/16 ; G01R29/10
摘要:
An antenna testing device includes an analyzer, a transmission probe electrically connected to the analyzer, a receiving probe electrically connected to the analyzer, and a shielded box having a cutoff frequency. The analyzer generates a test signal the frequency of which is lower than the cutoff frequency, the transmission probe receive the test signal and sends the test signal to the shielded box. The antenna is coupled with the transmission probe and generates a coupled signal, the receiving probe receives the coupled signal and sends the coupled signal to the analyzer. The analyzer analyzes the coupled signal and the test signal, the analyzer calculates the return loss of the antenna.
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