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US08392759B2 Test method, test program, test apparatus, and test system 失效
测试方法,测试程序,测试仪器和测试系统

  • Patent Title: Test method, test program, test apparatus, and test system
  • Patent Title (中): 测试方法,测试程序,测试仪器和测试系统
  • Application No.: US12789800
    Application Date: 2010-05-28
  • Publication No.: US08392759B2
    Publication Date: 2013-03-05
  • Inventor: Masaru Mishuku
  • Applicant: Masaru Mishuku
  • Applicant Address: JP Kawasaki
  • Assignee: Fujitsu Limited
  • Current Assignee: Fujitsu Limited
  • Current Assignee Address: JP Kawasaki
  • Agency: Staas & Halsey LLP
  • Priority: JP2009-162290 20090709
  • Main IPC: G06F11/00
  • IPC: G06F11/00
Test method, test program, test apparatus, and test system
Abstract:
A test method including executing a data transfer instruction with regard to transfer of data between a plurality of multiplexed storage devices and a plurality of main systems logically connected to the plurality of storage devices, storing an initial value of an operand upon execution of the data transfer instruction, re-setting the stored initial value to the operand upon occurrence of an interrupt triggered by an exception, and repeatedly executing the data transfer instruction and re-setting the stored initial value to the operand, by the main system accessing the storage device, until the data transfer instruction is completed normally.
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