Invention Grant
- Patent Title: Test method, test program, test apparatus, and test system
- Patent Title (中): 测试方法,测试程序,测试仪器和测试系统
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Application No.: US12789800Application Date: 2010-05-28
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Publication No.: US08392759B2Publication Date: 2013-03-05
- Inventor: Masaru Mishuku
- Applicant: Masaru Mishuku
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2009-162290 20090709
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A test method including executing a data transfer instruction with regard to transfer of data between a plurality of multiplexed storage devices and a plurality of main systems logically connected to the plurality of storage devices, storing an initial value of an operand upon execution of the data transfer instruction, re-setting the stored initial value to the operand upon occurrence of an interrupt triggered by an exception, and repeatedly executing the data transfer instruction and re-setting the stored initial value to the operand, by the main system accessing the storage device, until the data transfer instruction is completed normally.
Public/Granted literature
- US20110010586A1 TEST METHOD, TEST PROGRAM, TEST APPARATUS, AND TEST SYSTEM Public/Granted day:2011-01-13
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