An apparatus for providing pattern detection may include a processor. The processor may be configured to iteratively test different models and corresponding scales for each of the models. The models may be employed for modeling parameters corresponding to a visually detected data. The processor may be further configured to evaluate each of the models over a plurality of iterations based on a function evaluation of each of the models, select one of the models based on the function evaluation of the selected one of the models, and utilize the selected one of the models for fitting the data.