发明授权
US08410618B2 Microelectronic assembly with joined bond elements having lowered inductance
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具有接合结合元件的微电子组件具有降低的电感
- 专利标题: Microelectronic assembly with joined bond elements having lowered inductance
- 专利标题(中): 具有接合结合元件的微电子组件具有降低的电感
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申请号: US13196192申请日: 2011-08-02
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公开(公告)号: US08410618B2公开(公告)日: 2013-04-02
- 发明人: Belgacem Haba , Philip Damberg , Philip R. Osborn
- 申请人: Belgacem Haba , Philip Damberg , Philip R. Osborn
- 申请人地址: US CA San Jose
- 专利权人: Tessera, Inc.
- 当前专利权人: Tessera, Inc.
- 当前专利权人地址: US CA San Jose
- 代理机构: Lerner, David, Littenberg, Krumholz & Mentlik, LLP
- 优先权: KR10-2010-0040446 20100430
- 主分类号: H01L23/48
- IPC分类号: H01L23/48 ; H01L23/52 ; H01L29/40
摘要:
A microelectronic assembly includes a semiconductor chip having chip contacts exposed at a first face and a substrate juxtaposed with a face of the chip. A conductive bond element can electrically connect a first chip contact with a first substrate contact of the substrate, and a second conductive bond element can electrically connect the first chip contact with a second substrate contact. The first bond element can have a first end metallurgically joined to the first chip contact and a second end metallurgically joined to the first substrate contact. A first end of the second bond element can be metallurgically joined to the first bond element. The second bond element may or may not touch the first chip contact or the substrate contact. A third bond element can be joined to ends of first and second bond elements which are joined to substrate contacts or to chip contacts. In one embodiment, a bond element can have a looped connection, having first and second ends joined at a first contact and a middle portion joined to a second contact.
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