发明授权
- 专利标题: Leakage tolerant phase locked loop circuit device
- 专利标题(中): 泄漏容限锁相环电路器件
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申请号: US13342453申请日: 2012-01-03
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公开(公告)号: US08410835B1公开(公告)日: 2013-04-02
- 发明人: Michael A. Sorna , Pradeep Thiagarajan
- 申请人: Michael A. Sorna , Pradeep Thiagarajan
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Biggers & Ohanian, LLP.
- 代理商 H. Barrett Spraggins; Daniel H. Schnurmann
- 主分类号: H03L7/06
- IPC分类号: H03L7/06
摘要:
Leakage tolerant phase locked loop (PLL) circuit devices and methods of locking phases of output phase signals to a phase of a reference signal using a leakage tolerant PLL circuit device are provided. Embodiments include a PLL circuit device comprising: a primary loop and a secondary correction circuit. The primary loop includes a phase detector, an error controller, a voltage controlled oscillator (VCO), and feedback divider. The secondary correction circuit is configured to generate and provide a secondary error-frequency signal to the error controller. The secondary correction circuit is configured to generate the secondary error-frequency signal in response to detecting a particular edge of a divided VCO output signal. The primary loop is configured to control a frequency adjustment based on at least one of a first error-frequency-increase signal, a first error-frequency-decrease signal, and the secondary error-frequency signal.
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