Invention Grant
- Patent Title: Nonvolatile memory device and program method thereof
- Patent Title (中): 非易失性存储器件及其程序方法
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Application No.: US13100134Application Date: 2011-05-03
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Publication No.: US08422292B2Publication Date: 2013-04-16
- Inventor: Yoon-Hee Choi , BoGeun Kim
- Applicant: Yoon-Hee Choi , BoGeun Kim
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2010-0044556 20100512
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
A nonvolatile memory device and a programming method thereof perform a programming verification step including a selective verification step and a sequential verification step. In the selective verification step, a data input/output (I/O) circuit selectively precharges a selected bit line according to a temporary programmed state of stored data. In the sequential verification step, the data I/O circuit selectively precharges each bit line according to the result of the previous selective verification step or a previous sequential verification step. According to the programming method, because a memory cell not requiring a programming verification step is not precharged in the programming verification step, an ON cell current does not flow therethrough. Accordingly, the current flowing through a common source line during verification can be reduced.
Public/Granted literature
- US20110280083A1 NONVOLATILE MEMORY DEVICE AND PROGRAM METHOD THEREOF Public/Granted day:2011-11-17
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