Invention Grant
- Patent Title: Non-volatile semiconductor memory device
- Patent Title (中): 非易失性半导体存储器件
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Application No.: US13091589Application Date: 2011-04-21
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Publication No.: US08422299B2Publication Date: 2013-04-16
- Inventor: Natsuki Iguchi , Takashi Maeda
- Applicant: Natsuki Iguchi , Takashi Maeda
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2011-002028 20110107
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
According to one embodiment, a non-volatile semiconductor memory device comprises memory strings. Each memory string comprises a semiconductor layer, control gates, a first selection gate, and a second selection gate. A semiconductor layer comprises a pair of pillar portions which extend in a vertical direction to a substrate, and a coupling portion formed to couple the pair of pillar portions. Control gates orthogonally intersect one of the pair of pillar portions or the other of the pair of pillar portions. A first selection gate orthogonally intersects one of the pair of pillar portions and is formed above the control gates. A second selection gate orthogonally intersects the other of the pair of pillar portions, is formed above the control gates, and is on the same level as the first selection gate as well as integrated with the first selection gate.
Public/Granted literature
- US20120176836A1 NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE Public/Granted day:2012-07-12
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