发明授权
- 专利标题： Abnormality detecting apparatus for detecting abnormality at interface portion of contact arm
- 专利标题（中）： 异常检测装置，用于检测接触臂的界面部分的异常
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申请号： US12738780申请日： 2007-10-31
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公开(公告)号： US08422762B2公开(公告)日： 2013-04-16
- 发明人: Masayoshi Ichikawa , Hiroki Ikeda
- 申请人： Masayoshi Ichikawa , Hiroki Ikeda
- 申请人地址： JP Tokyo
- 专利权人： Advantest Corporation
- 当前专利权人： Advantest Corporation
- 当前专利权人地址： JP Tokyo
- 代理机构： Greenblum & Bernstein, P.L.C.
- 国际申请： PCT/JP2007/071203 WO 20071031
- 国际公布： WO2009/057203 WO 20090507
- 主分类号： G06K9/00
- IPC分类号： G06K9/00
摘要：
An abnormality detecting apparatus includes an imaging device for obtaining image data of a TIM, a failure detecting section for detecting appearance failures of the TIM on the basis of the image data of the TIM obtained by the imaging device, and a determining device for determining whether an abnormality occurs at the TIM on the basis of a detection result by the failure detecting section.
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