发明授权
- 专利标题: Device and method for evaluating a temperature
- 专利标题(中): 用于评估温度的装置和方法
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申请号: US13291252申请日: 2011-11-08
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公开(公告)号: US08430562B2公开(公告)日: 2013-04-30
- 发明人: Yoav Weizman , Lior Aviv , Shai Shperber
- 申请人: Yoav Weizman , Lior Aviv , Shai Shperber
- 申请人地址: US TX Austin
- 专利权人: Freescale Semiconductor, Inc.
- 当前专利权人: Freescale Semiconductor, Inc.
- 当前专利权人地址: US TX Austin
- 主分类号: G01K7/00
- IPC分类号: G01K7/00
摘要:
A method for evaluating temperature is disclosed. The method includes setting a configuration of a configurable delay line out of multiple possible configurations, and delaying a first input signal by a temperature sensitive delay line, delaying a second input signal by the configurable delay line. The configurable delay line is less sensitive to temperature than the temperature sensitive delay line. The method also includes detecting, by a phase detector, a delay difference between a delay introduced by the temperature sensitive delay line and a delay introduced by the configurable delay line, repeating the setting, delaying of the first input signal, delaying of the second input signal and detecting, until the delay difference is below a threshold, and evaluating the temperature of the temperature sensitive delay line in response to a configuration of the configurable delay line that results in the delay difference that is below the threshold.
公开/授权文献
- US20120051398A1 DEVICE AND METHOD FOR EVALUATING A TEMPERATURE 公开/授权日:2012-03-01
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