发明授权
- 专利标题： Wave detector circuit and high-frequency circuit
- 专利标题（中）： 波检测电路和高频电路
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申请号： US12894245申请日： 2010-09-30
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公开(公告)号： US08432213B2公开(公告)日： 2013-04-30
- 发明人: Shingo Oishi , Toshiya Tsukao
- 申请人： Shingo Oishi , Toshiya Tsukao
- 申请人地址： JP Osaka
- 专利权人： Sharp Kabushiki Kaisha
- 当前专利权人： Sharp Kabushiki Kaisha
- 当前专利权人地址： JP Osaka
- 代理机构： Birch, Stewart, Kolasch & Birch, LLP
- 优先权： JP2009-256975 20091110
- 主分类号： H03K17/60
- IPC分类号： H03K17/60 ; H02M7/06
摘要：
The temperature dependence of detection characteristics in a wave detector circuit is suppressed. A bias resistor and/or a load resistor are/is constituted by a resistive element having a high temperature coefficient, whereby a shift in detected output along with a change in temperature of a wave detector diode included in a diode detector circuit is canceled by a shift in detected output along with a change in temperature of the bias resistor and/or a shift in detected output along with a change in temperature of the load resistor.
公开/授权文献
- US08405446B2 Wave detector circuit and high-frequency circuit 公开/授权日：2013-03-26
信息查询
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