发明授权
- 专利标题: Measuring apparatus, parallel measuring apparatus, testing apparatus and electronic device
- 专利标题(中): 测量装置,平行测量装置,试验装置和电子装置
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申请号: US12853851申请日: 2010-08-10
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公开(公告)号: US08436604B2公开(公告)日: 2013-05-07
- 发明人: Kazuhiro Yamamoto , Toshiyuki Okayasu
- 申请人: Kazuhiro Yamamoto , Toshiyuki Okayasu
- 申请人地址: JP Tokyo
- 专利权人: Advantest Corporation
- 当前专利权人: Advantest Corporation
- 当前专利权人地址: JP Tokyo
- 优先权: JP2008-083509 20080327
- 主分类号: G01R25/00
- IPC分类号: G01R25/00
摘要:
Provided is a measurement apparatus that measures a signal under measurement, comprising a first oscillation circuit that receives one pulse of the signal under measurement and begins oscillating according to the pulse of the signal under measurement to output a first oscillated signal; a second oscillation circuit that receives one pulse of a reference signal and begins oscillating according to the pulse of the reference signal to output a second oscillated signal having a period that is different from a period of the first oscillated signal; and a first sampling section that samples the first oscillated signal according to a pulse of the second oscillated signal. The first oscillation circuit and the second oscillation circuit each include a control section that selects one pulse; a delay section that delays the pulse; and a loop line that feeds the pulse back to an input terminal of the delay section.
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