Invention Grant
- Patent Title: Method and device for scanning light
- Patent Title (中): 扫描光线的方法和装置
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Application No.: US13100312Application Date: 2011-05-04
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Publication No.: US08437063B2Publication Date: 2013-05-07
- Inventor: Yizhar Weiss , Mordekhai Velger , Sivan Natan-Knaz , Raviv Erlich , Alexander Sromin
- Applicant: Yizhar Weiss , Mordekhai Velger , Sivan Natan-Knaz , Raviv Erlich , Alexander Sromin
- Applicant Address: IL Rehovot
- Assignee: Scaneva Ltd.
- Current Assignee: Scaneva Ltd.
- Current Assignee Address: IL Rehovot
- Agency: D. Kliger IP. Services Ltd.
- Priority: IL165212 20041115
- Main IPC: G02B26/08
- IPC: G02B26/08
Abstract:
A method of scanning a light beam is disclosed. The method comprises scanning the light beam along a first axis and scanning the light beam along a second axis, such that a functional dependence of the scanning along the first axis is substantially a step-wave, and a functional dependence of the scanning along the second axis is other than a step-wave.
Public/Granted literature
- US20110286066A1 METHOD AND DEVICE FOR SCANNING LIGHT Public/Granted day:2011-11-24
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