Invention Grant
- Patent Title: Gate structures
- Patent Title (中): 门结构
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Application No.: US13599507Application Date: 2012-08-30
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Publication No.: US08441107B2Publication Date: 2013-05-14
- Inventor: Peng-Soon Lim , Chia-Pin Lin , Kuang-Yuan Hsu
- Applicant: Peng-Soon Lim , Chia-Pin Lin , Kuang-Yuan Hsu
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Main IPC: H01L29/06
- IPC: H01L29/06

Abstract:
An apparatus includes a first device. The first device includes a first projection and a first gate structure, the first projection extending upwardly from a substrate and having a first channel region therein, and the first gate structure engaging the first projection adjacent the first channel region. The first structure includes an opening over the first channel region, and a conformal, pure metal with a low resistivity disposed in the opening. The apparatus also includes a second device that includes a second projection and a second gate structure, the second projection extending upwardly from the substrate and having a second channel region therein, and the second gate structure engaging the second projection adjacent the second channel region. The second structure includes a silicide disposed over the second channel region, wherein the silicide includes a metal that is the same metal disposed in the opening.
Public/Granted literature
- US20120319192A1 Gate Structures Public/Granted day:2012-12-20
Information query
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