Invention Grant
- Patent Title: Color filter array alignment detection
- Patent Title (中): 滤色片阵列对准检测
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Application No.: US12875077Application Date: 2010-09-02
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Publication No.: US08441562B1Publication Date: 2013-05-14
- Inventor: Gabor Szedo , Jose R. Alvarez
- Applicant: Gabor Szedo , Jose R. Alvarez
- Applicant Address: US CA San Jose
- Assignee: Xilinx, Inc.
- Current Assignee: Xilinx, Inc.
- Current Assignee Address: US CA San Jose
- Agent LeRoy D. Maunu
- Main IPC: H04N5/335
- IPC: H04N5/335

Abstract:
In one embodiment of the present invention, a method for determining a phase alignment of a Bayer color filter array is provided. A quincunx lattice of the color filter array corresponding to a first color component is determined from an input frame of image data. Elements of the color filter array corresponding to first and second rectangular lattices of the color filter array are selected. Second and third color components corresponding to elements of the first and second rectangular lattices are determined from the sample values in an input frame of image data.
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