Invention Grant
US08442279B2 Assessing biometric sample quality using wavelets and a boosted classifier
有权
使用小波和增强分类器评估生物特征样本质量
- Patent Title: Assessing biometric sample quality using wavelets and a boosted classifier
- Patent Title (中): 使用小波和增强分类器评估生物特征样本质量
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Application No.: US12457959Application Date: 2009-06-26
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Publication No.: US08442279B2Publication Date: 2013-05-14
- Inventor: Weizhong Yan , Frederick W Wheeler , Peter H Tu , Xiaoming Liu
- Applicant: Weizhong Yan , Frederick W Wheeler , Peter H Tu , Xiaoming Liu
- Applicant Address: US MD Bethesda
- Assignee: Lockheed Martin Corporation
- Current Assignee: Lockheed Martin Corporation
- Current Assignee Address: US MD Bethesda
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A biometric sample training device, a biometric sample quality assessment device, a biometric fusion recognition device, an integrated biometric fusion recognition system and example processes in which each may be used are described. Wavelets and a boosted classifier are used to assess the quality of biometric samples, such as facial images. The described biometric sample quality assessment approach provides accurate and reliable quality assessment values that are robust to various degradation factors, e.g., such as pose, illumination, and lighting in facial image biometric samples. The quality assessment values allow biometric samples of different sample types to be combined to support complex recognition techniques used by, for example, biometric fusion devices, resulting in improved accuracy and robustness in both biometric authentication and biometric recognition.
Public/Granted literature
- US20100111376A1 Assesssing biometric sample quality using wavelets and a boosted classifier Public/Granted day:2010-05-06
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