Invention Grant
- Patent Title: Nondestructive inspection method and system
- Patent Title (中): 无损检测方法及系统
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Application No.: US12433168Application Date: 2009-04-30
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Publication No.: US08442301B2Publication Date: 2013-05-14
- Inventor: Matthew Edward Dragovich , Patrick Joseph Howard , Joshua Brian Jamison , Toby George Darkins, Jr. , Joseph Manuel Portaz
- Applicant: Matthew Edward Dragovich , Patrick Joseph Howard , Joshua Brian Jamison , Toby George Darkins, Jr. , Joseph Manuel Portaz
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: General Electric Company
- Agent Sushupta T. Sudarshan; David J. Clement
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A method and system for nondestructively detecting and quantifying material anomalies within materials, including composite articles. The method entails performing a three-dimensional imaging scan technique, such as a computed tomography scan, of the material and a reference standard such that a test image of the material and a reference image of the reference standard appear in a plurality of two-dimensional scan views generated by the scan technique. The reference images are located in the scan views and normalized to determine at least an average value of the pixel data for the reference images. Values of pixel data of the test image are determined in each scan view, and then compared to the pixel data of the reference images to detect the presence of an anomaly in the test images. The detected anomaly in at least one of the test images of the scan views is then compared to a requirement standard for the material.
Public/Granted literature
- US20100278440A1 NONDESTRUCTIVE INSPECTION METHOD AND SYSTEM Public/Granted day:2010-11-04
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