Invention Grant
US08446494B2 Automatic redeye detection based on redeye and facial metric values
有权
基于红眼和面部度量值的自动红眼检测
- Patent Title: Automatic redeye detection based on redeye and facial metric values
- Patent Title (中): 基于红眼和面部度量值的自动红眼检测
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Application No.: US12865855Application Date: 2008-02-01
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Publication No.: US08446494B2Publication Date: 2013-05-21
- Inventor: Matthew D. Gaubatz , Robert Alan Ulichney
- Applicant: Matthew D. Gaubatz , Robert Alan Ulichney
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- International Application: PCT/US2008/001380 WO 20080201
- International Announcement: WO2009/096920 WO 20090806
- Main IPC: H04N5/217
- IPC: H04N5/217

Abstract:
Candidate redeye areas (24) are determined in an input image (20). In this process, a respective set of one or more redeye metric values (28) is associated with each of the candidate redeye areas (24). Candidate face areas (30) are ascertained in the input image (20). In this process, a respective set of one or more face metric values (34) is associated with each of the candidate face areas (30). A respective joint metric vector (78) is assigned to each of the candidate redeye areas (24). The joint metric vector (78) includes metric values that are derived from the respective set of redeye metric values (28) and the set of face metric values (34) associated with a selected one of the candidate face areas (30). Each of one or more of the candidate redeye areas (24) is classified as either a redeye artifact or a non-redeye artifact based on the respective joint metric vector (78) assigned to the candidate redeye area (24).
Public/Granted literature
- US20110001850A1 Automatic Redeye Detection Public/Granted day:2011-01-06
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