Invention Grant
US08446591B2 Method for evaluating characteristics of optical modulator having Mach-Zehnder interferometers
有权
用于评估具有马赫 - 策德尔干涉仪的光学调制器的特性的方法
- Patent Title: Method for evaluating characteristics of optical modulator having Mach-Zehnder interferometers
- Patent Title (中): 用于评估具有马赫 - 策德尔干涉仪的光学调制器的特性的方法
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Application No.: US12921833Application Date: 2008-03-13
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Publication No.: US08446591B2Publication Date: 2013-05-21
- Inventor: Tetsuya Kawanishi , Shinya Nakajima , Satoshi Shinada
- Applicant: Tetsuya Kawanishi , Shinya Nakajima , Satoshi Shinada
- Applicant Address: JP Tokyo
- Assignee: National Institute of Information and Communications Technology
- Current Assignee: National Institute of Information and Communications Technology
- Current Assignee Address: JP Tokyo
- Agency: Posz Law Group, PLC
- International Application: PCT/JP2008/000575 WO 20080313
- International Announcement: WO2009/113128 WO 20090917
- Main IPC: G01N21/55
- IPC: G01N21/55 ; G01B9/02 ; H04B10/04 ; H04B10/12
Abstract:
ProblemsTo provide a method for evaluating characteristics of MZ interferometers in an optical modulator having a plurality of MZ interferometers.Means for Solving ProblemsWhen an optical modulator includes a plurality of MZ interferometers, the 0-degree component contains a signal derived from an MZ interferometer other than the MZ interferometers for evaluating the characteristic. For this, it is impossible to accurately evaluate the characteristic of the MZ interferometers. The present invention does not use the 0-degree component normally having the highest intensity. That is, the characteristic of the MZ interferometers are evaluated by using a side band intensity of the component other than the 0-degree component.
Public/Granted literature
- US20110176141A1 Method for Evaluating Characteristics of Optical Modulator Having Mach-Zehnder Interferometers Public/Granted day:2011-07-21
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