Invention Grant
- Patent Title: Chromatography inspection apparatus and method for judging degradation of chromatography specimen
- Patent Title (中): 色谱检测装置和色谱试样降解的方法
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Application No.: US12740447Application Date: 2008-10-14
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Publication No.: US08447084B2Publication Date: 2013-05-21
- Inventor: Masahiro Aga , Koji Miyoshi , Mie Takahashi , Hideyuki Kurokawa , Takahiko Tanida , Ryosuke Yamada , Yoko Matsuda
- Applicant: Masahiro Aga , Koji Miyoshi , Mie Takahashi , Hideyuki Kurokawa , Takahiko Tanida , Ryosuke Yamada , Yoko Matsuda
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Hamre, Schumann, Mueller & Larson, P.C.
- Priority: JP2007-285616 20071102
- International Application: PCT/JP2008/002888 WO 20081014
- International Announcement: WO2009/057252 WO 20090507
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01N21/84 ; G01N33/543
Abstract:
By measuring a luminance difference between predetermined two points or a luminance variation in a predetermined region in a state in which a liquid sample is developed in a chromatography specimen 1, and comparing the luminance difference or the luminance variation with a preset reference value, it is possible to automatically detect degradation such as a decrease in hydrophilicity in the lower portion of a liquid-impermeable sheet material 8 during a chromatography inspection, thereby enabling an accurate inspection.
Public/Granted literature
- US20100260411A1 CHROMATOGRAPHY INSPECTION APPARATUS AND METHOD FOR JUDGING DEGRADATION OF CHROMATOGRAPHY SPECIMEN Public/Granted day:2010-10-14
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