Invention Grant
- Patent Title: Method to detect beryllium by fluorescence
- Patent Title (中): 通过荧光检测铍的方法
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Application No.: US12978483Application Date: 2010-12-24
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Publication No.: US08450117B2Publication Date: 2013-05-28
- Inventor: Anoop Agrawal , John P. Cronin , Juan Carlos Lopez Tonazzi
- Applicant: Anoop Agrawal , John P. Cronin , Juan Carlos Lopez Tonazzi
- Applicant Address: US AZ Lowell, Tucson
- Assignee: Berylliant Inc.
- Current Assignee: Berylliant Inc.
- Current Assignee Address: US AZ Lowell, Tucson
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G01N33/20

Abstract:
A method of determining beryllium or a beryllium compound thereof in a sample is disclosed by measuring fluorescence. This method discloses improved sample preparation methods, particularly for refractory beryllium materials. The method also discloses methods to improve the detection limit of beryllium including use of optical filters with specific characteristics for selecting the emission wavelengths of the fluorescence signal.
Public/Granted literature
- US20110165696A1 Method to detect Beryllium by Flourescence Public/Granted day:2011-07-07
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