发明授权
US08450695B2 Circuit arrangement for counting X-ray radiation X-ray quanta by way of quanta-counting detectors, and also an application-specific integrated circuit and an emitter-detector system 有权
用于通过量子计数检测器计数X射线辐射X射线量子的电路装置,以及专用集成电路和发射极检测器系统

  • 专利标题: Circuit arrangement for counting X-ray radiation X-ray quanta by way of quanta-counting detectors, and also an application-specific integrated circuit and an emitter-detector system
  • 专利标题(中): 用于通过量子计数检测器计数X射线辐射X射线量子的电路装置,以及专用集成电路和发射极检测器系统
  • 申请号: US12953539
    申请日: 2010-11-24
  • 公开(公告)号: US08450695B2
    公开(公告)日: 2013-05-28
  • 发明人: Steffen KapplerKarl Stierstorfer
  • 申请人: Steffen KapplerKarl Stierstorfer
  • 申请人地址: DE Munich
  • 专利权人: Siemens Aktiengesellschaft
  • 当前专利权人: Siemens Aktiengesellschaft
  • 当前专利权人地址: DE Munich
  • 代理机构: Harness, Dickey & Pierce, P.L.C.
  • 优先权: DE102009055807 20091126
  • 主分类号: G01T1/24
  • IPC分类号: G01T1/24
Circuit arrangement for counting X-ray radiation X-ray quanta by way of quanta-counting detectors, and also an application-specific integrated circuit and an emitter-detector system
摘要:
In at least one embodiment, a circuit arrangement of a quanta-counting detector with a multiplicity of detector elements is disclosed, wherein the X-ray quanta registered in each detector element generate a signal profile. In at least one embodiment, the circuit arrangement, in each detector element, includes: at least one first comparator with a first energy threshold lying in the energy range of the measured X-ray quanta and at least one second comparator with a second energy threshold lying above the energy range of the measured X-ray quanta, the at least one first and second comparators being connected to the detector element. Further, the at least two comparators have a logical interconnection, wherein at least a first comparator and a second comparator are connected to the inputs of an XOR gate, and each XOR gate connected to a first comparator is connected to precisely one edge-sensitive counter.
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