发明授权
US08450697B2 Discrimination parameter calculation method for photon detectors, and nuclear medicine diagnostic apparatus using same
有权
用于光子检测器的鉴别参数计算方法,以及使用其的核医学诊断装置
- 专利标题: Discrimination parameter calculation method for photon detectors, and nuclear medicine diagnostic apparatus using same
- 专利标题(中): 用于光子检测器的鉴别参数计算方法,以及使用其的核医学诊断装置
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申请号: US12597814申请日: 2007-04-27
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公开(公告)号: US08450697B2公开(公告)日: 2013-05-28
- 发明人: Atsushi Ohtani
- 申请人: Atsushi Ohtani
- 申请人地址: JP Kyoto
- 专利权人: Shimadzu Corporation
- 当前专利权人: Shimadzu Corporation
- 当前专利权人地址: JP Kyoto
- 代理机构: Cheng Law Group, PLLC
- 国际申请: PCT/JP2007/059179 WO 20070427
- 国际公布: WO2008/139517 WO 20081120
- 主分类号: G01T1/00
- IPC分类号: G01T1/00 ; A61B6/00
摘要:
A discrimination parameter calculation method for photon detectors in this invention, applies two types of fitting functions which approximate waveforms of count numbers relative to energy ratios to the data having accumulated output waveform signals, and calculates fitting parameters of both the fitting functions. Based on both the fitting parameters, count numbers which are 1/n of peaks of both the fitting functions, and a value of the energy ratio of both the fitting functions corresponding to the count numbers is calculated as discrimination parameter k. Thus, whatever kind first photon detecting elements 35 and second photon detecting elements 37 may be, since discrimination parameter k is automatically calculated based on the fitting parameters after carrying out a fitting with the fitting functions, the discrimination parameter can be calculated with high accuracy. It is therefore possible to obtain relatively easily discrimination parameter k which can fully bring out performance of the photon detectors 17.
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