Invention Grant
- Patent Title: Method for calibrating a device for optical curvature monitoring
- Patent Title (中): 校准光学曲率监测装置的方法
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Application No.: US13125602Application Date: 2009-10-22
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Publication No.: US08451441B2Publication Date: 2013-05-28
- Inventor: Yann Nicolas , Philippe Lembeye
- Applicant: Yann Nicolas , Philippe Lembeye
- Applicant Address: FR
- Assignee: Technip France
- Current Assignee: Technip France
- Current Assignee Address: FR
- Agency: Ostrolenk Faber LLP
- Priority: FR0805942 20081024
- International Application: PCT/FR2009/052023 WO 20091022
- International Announcement: WO2010/046602 WO 20100429
- Main IPC: G01B11/16
- IPC: G01B11/16 ; G01J1/10

Abstract:
A method for calibrating a device for monitoring the curvature of a stiffener (18) of a flexible sea line: A monitoring device has a deformable rod (26) having a central axis (C) and at least three optical sensors (29, 30, 31) maintained pressed against the perimeter of the rod (26). The method includes the steps, for different consecutive orientations of bending planes around the central axis; bending the rod (26) according to the same curvature radius; measuring the deformation of the sensors (29, 30, 31) during the bending; using the measured deformations to extrapolate a sine function of the deformation for each sensor according to the orientation of the bending plane; calculating error-correction coefficients according to the angular shift between the extrapolated sine functions and according to the amplitude of the extrapolated sine curves.
Public/Granted literature
- US20110199608A1 METHOD FOR CALIBRATING A DEVICE FOR OPTICAL CURVATURE MONITORING Public/Granted day:2011-08-18
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