Invention Grant
- Patent Title: Calibrating and positioning structure of scanning apparatus
- Patent Title (中): 扫描仪的校准和定位结构
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Application No.: US12910887Application Date: 2010-10-25
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Publication No.: US08451517B2Publication Date: 2013-05-28
- Inventor: Te-Chen Peng , Li-Ju Huang
- Applicant: Te-Chen Peng , Li-Ju Huang
- Applicant Address: TW Taoyuan Hsien
- Assignee: TECO Image System Co., Ltd.
- Current Assignee: TECO Image System Co., Ltd.
- Current Assignee Address: TW Taoyuan Hsien
- Priority: TW99124798A 20100727
- Main IPC: H04N1/04
- IPC: H04N1/04

Abstract:
A calibrating and positioning structure of a scanning apparatus is provided. The scanning apparatus includes a scanning platform and a scanning window. The scanning window has a wide edge. The calibrating and positioning structure includes a calibrating part and at least one positioning part. The calibrating part is disposed on the scanning platform, and aligned with the wide edge of the scanning window. The at least one positioning part is partially overlapped with the calibrating part, wherein the positioning part is not aligned with the wide edge of the scanning window.
Public/Granted literature
- US20120026557A1 CALIBRATING AND POSITIONING STRUCTURE OF SCANNING APPARATUS Public/Granted day:2012-02-02
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