Invention Grant
- Patent Title: Phase based measurement corrections
- Patent Title (中): 基于相位的测量校正
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Application No.: US12517825Application Date: 2007-12-17
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Publication No.: US08451880B2Publication Date: 2013-05-28
- Inventor: Charles Robert Offer
- Applicant: Charles Robert Offer
- Applicant Address: GB London
- Assignee: Qinetiq Limited
- Current Assignee: Qinetiq Limited
- Current Assignee Address: GB London
- Agency: Oliff & Berridge, PLC
- Priority: GB0625244.9 20061219
- International Application: PCT/GB2007/004809 WO 20071217
- International Announcement: WO2008/075002 WO 20080626
- Main IPC: H04B1/00
- IPC: H04B1/00
Abstract:
A method for providing correction values for phase based measurements. Where averaging techniques are employed for exploiting redundancy in multiple measurements, by constraining the phase ambiguity in a correction value to be an integer multiple of the carrier wavelength, carrier phase based measurements can be used.
Public/Granted literature
- US20100166044A1 PHASE BASED MEASUREMENT CORRECTIONS Public/Granted day:2010-07-01
Information query
