Invention Grant
- Patent Title: Drop test apparatus
- Patent Title (中): 跌落试验装置
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Application No.: US13216266Application Date: 2011-08-24
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Publication No.: US08453491B2Publication Date: 2013-06-04
- Inventor: Meng-Bin Yu , Ming-Hui Luo , Chang-Jun Li , Yu-Lin Liu
- Applicant: Meng-Bin Yu , Ming-Hui Luo , Chang-Jun Li , Yu-Lin Liu
- Applicant Address: CN Wuhan TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (WuHan) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (WuHan) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Wuhan TW New Taipei
- Agency: Altis Law Group, Inc.
- Main IPC: G01N3/00
- IPC: G01N3/00 ; G01D21/00

Abstract:
A drop test apparatus performs a drop test on a product. The drop test apparatus includes a drop control module and a support module. The drop control module includes a bottom plate and a support beam substantially perpendicularly attached to the bottom plate. The support module is attached at a predetermined height to the support beam and includes a lever for detecting whether the product is placed in a desired position. A support panel is disposed at a first end of the lever for supporting the product. A second end of the lever is under a predetermined force for maintaining the lever in a balanced state when the product is placed in the desired position.
Public/Granted literature
- US20120227464A1 DROP TEST APPARATUS Public/Granted day:2012-09-13
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