Invention Grant
- Patent Title: Multi-photon ionization spectrometer
- Patent Title (中): 多光子电离光谱仪
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Application No.: US12880179Application Date: 2010-09-13
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Publication No.: US08455813B2Publication Date: 2013-06-04
- Inventor: Israel Schechter , Valery Bulatov
- Applicant: Israel Schechter , Valery Bulatov
- Applicant Address: IL Haifa
- Assignee: Technion Research and Development Foundation Ltd.
- Current Assignee: Technion Research and Development Foundation Ltd.
- Current Assignee Address: IL Haifa
- Agency: Pearl Cohen Zedek Latzer, LLP
- Main IPC: H01J27/24
- IPC: H01J27/24

Abstract:
A method of assaying a solid or liquid material, the method comprising: illuminating a sample of the material with pulses of light at a plurality of different wavelengths at which atoms and/or molecules in the material are ionized in multiphoton ionization (MPI) process; generating a value responsive to charge produced in the ionization process for each wavelength to provide an MPI spectrum for the material; and processing the MPI spectrum to assay an atom or molecule in the material.
Public/Granted literature
- US20110062321A1 MULTI-PHOTON IONIZATION SPECTROMETER Public/Granted day:2011-03-17
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