发明授权
US08456910B2 Nonvolatile memory cell with well extending under transistor and data storage capacitor of memory cell
有权
非易失性存储单元在存储器单元的晶体管和数据存储电容器下具有良好的扩展
- 专利标题: Nonvolatile memory cell with well extending under transistor and data storage capacitor of memory cell
- 专利标题(中): 非易失性存储单元在存储器单元的晶体管和数据存储电容器下具有良好的扩展
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申请号: US12846996申请日: 2010-07-30
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公开(公告)号: US08456910B2公开(公告)日: 2013-06-04
- 发明人: Dzianis Lukashevich
- 申请人: Dzianis Lukashevich
- 申请人地址: DE Neubiberg
- 专利权人: Infineon Technologies AG
- 当前专利权人: Infineon Technologies AG
- 当前专利权人地址: DE Neubiberg
- 代理机构: Eschweiler & Associates, LLC
- 主分类号: G11C14/00
- IPC分类号: G11C14/00
摘要:
One embodiment relates to a memory device. The memory device includes a capacitor having a first capacitor plate and a second capacitor plate, wherein the first and second capacitor plates are separated by an insulating layer and are formed over a first portion of a semiconductor substrate. The memory device also includes a transistor having a source region, a drain region, and a gate region, where the gate region is coupled to the second capacitor plate. The transistor is formed over a second portion of the semiconductor substrate. A well region is disposed in the first and second portions of the semiconductor substrate and has a doping-type that is opposite a doping-type of the semiconductor substrate. Other embodiments are also disclosed.
公开/授权文献
- US20120026793A1 Nonvolatile Memory Cell With Extended Well 公开/授权日:2012-02-02
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