发明授权
US08461518B2 Method of collecting calibration data in radiation tomography apparatus
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辐射断层摄影仪中收集校准数据的方法
- 专利标题: Method of collecting calibration data in radiation tomography apparatus
- 专利标题(中): 辐射断层摄影仪中收集校准数据的方法
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申请号: US13145786申请日: 2009-01-23
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公开(公告)号: US08461518B2公开(公告)日: 2013-06-11
- 发明人: Tetsuro Mizuta , Yoshihiro Inoue , Masaharu Amano , Kazumi Tanaka , Atsushi Ohtani
- 申请人: Tetsuro Mizuta , Yoshihiro Inoue , Masaharu Amano , Kazumi Tanaka , Atsushi Ohtani
- 申请人地址: JP Kyoto
- 专利权人: Shimadzu Corporation
- 当前专利权人: Shimadzu Corporation
- 当前专利权人地址: JP Kyoto
- 代理机构: Cheng Law Group, PLLC
- 国际申请: PCT/JP2009/000251 WO 20090123
- 国际公布: WO2010/084528 WO 20100729
- 主分类号: G01D18/00
- IPC分类号: G01D18/00
摘要:
This invention has one object to provide a method of collecting calibration data in radiation tomography apparatus that allows reliable collection of calibration data with a wide detector ring. In order to achieve this purpose, in the method of collecting calibration data in radiation tomography apparatus according to this invention, the number of coincidence events is obtained while the phantom that emits annihilation gamma-ray pairs moves as to pass through an inner hole of the detector ring. Such configuration dose not need the phantom having a width equal or larger than the detector ring, and may realize reliable collection of calibration data. Moreover, it may be considered that annihilation gamma-ray pairs have been emitted in uniform property without depending on positions of the detector ring. As a result, calibration data that is more suitable for removal of a image artifact may be obtained.
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